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Performance of Monochromized and Aberration-Corrected TEMs
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2004
Year
Optical MaterialsEngineeringElectron-beam LithographyMicroscopyOptical TestingOptic DesignMicroscopy MethodOptical PropertiesAugust 1–5Light MicroscopyBiophysicsMaterials ScienceMicroanalysisMicroanalysis 2004UltrastructureMicrostructureBiologyMedicineAberration-corrected Tems
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.