G. Benner

Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene

Jannik C. Meyer, Franz Eder, Simon Kurasch et al. · Physical Review Letters · 2012 · 455 citations · Full text

Natural Sciences, Materials Science, Physics +15

Transmission electron microscopy at 20kV for imaging and spectroscopy

Ute Kaiser, Johannes Biskupek, Jannik C. Meyer et al. · Ultramicroscopy · 2011 · 201 citations

Natural Sciences, Materials Science, Physics +4

Visualizing a Homogeneous Blend in Bulk Heterojunction Polymer Solar Cells by Analytical Electron Microscopy

Martin Pfannmöller, Harald Flügge, G. Benner et al. · Nano Letters · 2011 · 164 citations

Engineering, Materials Engineering, Materials Science +17

SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II

R. Fink, M. Weiss, E. Umbach et al. · Journal of Electron Spectroscopy and Related Phenomena · 1997 · 154 citations

Natural Sciences, Chemistry, Analytical Chemistry +6

XPEEM WITH ENERGY-FILTERING: ADVANTAGES AND FIRST RESULTS FROM THE SMART PROJECT

Thomas Schmidt, U. Groh, R. Fink et al. · Surface Review and Letters · 2002 · 96 citations

Natural Sciences, Materials Science, Optics +13