Concepedia

Fabrication of high quality plan-view TEM specimens using the focused ion beam

Kerry J. O’Shea, D. McGrouther, Ciaran Ferguson, M. Jungbauer, S. Hühn, V. Moshnyaga, Donald A. MacLaren

Micron · 2014 · 26 citations · 36 references

Concepts

EngineeringMaterials EngineeringMaterials ScienceOpticsElectron MicroscopyTransmission Electron MicroscopyFocused Ion Beam LithographyFocused Ion Beam MachiningFocused Ion Beam PatterningFocused Ion Beam Scanning Electron MicroscopyScanning Transmission Electron Microscopy

References

36

Multiferroics: progress and prospects in thin films

R. Ramesh, Nicola A. Spaldin · Nature Materials · 2007 · 4K citations

Natural Sciences, Materials Engineering, Materials Science +12

<i>Electron Energy-Loss Spectroscopy in the Electron Microscope</i>

R.F. Egerton, Dale E. Newbury · Physics Today · 1987 · 3.4K citations

Natural Sciences, Physics, Analytical Chemistry +11

EELS log‐ratio technique for specimen‐thickness measurement in the TEM

T. Malis, Shangcong Cheng, R.F. Egerton · Journal of Electron Microscopy Technique · 1988 · 899 citations

Natural Sciences, Materials Engineering, Materials Science +11

TEM Sample Preparation and FIB-Induced Damage

Joachim Mayer, Lucille A. Giannuzzi, Takeo Kamino et al. · MRS Bulletin · 2007 · 873 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +6

Planar Patterned Magnetic Media Obtained by Ion Irradiation

C. Chappert, H. Bernas, J. Ferré et al. · Science · 1998 · 786 citations

Natural Sciences, Materials Engineering, Materials Science +17