TID Tolerance of Popular CubeSat Components

Ryan Kingsbury, F. Schmidt, William J. Blackwell, I. Osarentin, Robert T. Legge, K. Cahoy, Devon Sklair

2013 · 30 citations · 1 references

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Abstract

In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, popular microcontrollers (PIC24), SD memory cards and a TCXO.

References

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