Physics Today · 2004 · 167 citations · 0 references
PhotonicsSynchrotron RadiationHigh ResolutionEngineeringPhysicsMicroscopyApplied PhysicsLaser ApplicationsApodized AperturesLaser Beam PropagationJon OrloffIon Beam PhysicsIon Beam InstrumentationIon BeamNew YorkOptical SystemsParticle Beam PhysicsBeam Transport System
High Resolution Focused Ion Beams: FIB and Its Applications , Jon Orloff , Mark Utlaut , and Lynwood Swanson Kluwer Academic/Plenum, New York, 2003. $145.00 (303 pp.). ISBN 0-306-47350-X Buy at Amazon