Applied Optics · 1993 · 31 citations · 4 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationOptical MaterialsThin FilmsOptical Properties Of MaterialsOptical Properties Of SemiconductorsReflectionSemiconductor SurfacesSilicon MaterialsThin Film Optical PropertiesLong-term StabilityMaterial ReflectanceNormal Incidence ReflectionReflectanceSemiconductor StabilitySurface Stability
The normal-incidence reflectance of a Mo/Si multilayer mirror, with peak reflectance near 130 A, was measured over a period of 20 months by using synchrotron radiation. The measured reflectances were unchanged over this period of time, and this indicates that the material layers and interfaces were stable.
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