Publication | Open Access
Interferometric characterization of 160 fs far-infrared light pulses
116
Citations
10
References
1991
Year
EngineeringLaser ScienceWave OpticInterferometryLaser ApplicationsLaser PhysicsMid-infrared Laser TechnologyFiber OpticsOptical CharacterizationFirst Interferometric CharacterizationHigh-power LasersOptical PropertiesInfrared OpticFir LightOptical SystemsPhotonicsPulse GenerationPhysicsShort Pulse PhotoexcitationNatural SciencesSpectroscopyApplied PhysicsInterferometric Characterization
We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm−1.
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