Concepedia
Ultramicroscopy · 1999 · 31 citations · 4 references
Natural SciencesMaterials ScienceOptical MaterialsOpticsPhotonicsElectro-optic EffectsPhysical OpticsRefractive IndexNear-field BehaviorNear-field OpticsNear-field Tip Enhancement
4
New scanning tunneling microscopy tip for measuring surface topography
Yoshiaki Akama, E. Nishimura, Akira Sakai et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1990 · 153 citations
Natural Sciences, Materials Engineering, Materials Science +14
Near‐field optical microscopy in transmission and reflection modes in combination with force microscopy
N.F. van Hulst, M.H.P. Moers, B. Bölger · Journal of Microscopy · 1993 · 77 citations · Full text
Engineering, Bioengineering, Biomedical Engineering +15
Microfabrication of AFM tips using focused ion and electron beam techniques
H. Ximen, P. E. Russell · Ultramicroscopy · 1992 · 60 citations
Engineering, Materials Engineering, Materials Science +16
Resolution in collection-mode scanning optical microscopy
Eric L. Buckland, Patrick J. Moyer, M. A. Paesler · Journal of Applied Physics · 1993 · 52 citations
Engineering, Biomedical Engineering, Biomedical Optics +13