Concepedia

Study of the Si(001) clean surface structure using a six-circle surface X-ray diffractometer

Masamitu Takahasi, S. Nakatani, Yuki Ito, Toshio Takahashi, X.W. Zhang, Masami Ando

Surface Science · 1996 · 27 citations · 21 references

DOI

Concepts

References

21

Low Temperature Surface Cleaning of Silicon and Its Application to Silicon MBE

Akitoshi Ishizaka, Y. Shiraki · Journal of The Electrochemical Society · 1986 · 1.6K citations

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Scanning tunneling microscopy of Si(001)

Robert J. Hamers, R. M. Tromp, J. E. Demuth · Physical review. B, Condensed matter · 1986 · 851 citations

, , +17

Surface structure determination by X-ray diffraction

R. Feidenhans’l · Surface Science Reports · 1989 · 782 citations

, , +14

Direct observation of an increase in buckled dimers on Si(001) at low temperature

Robert A. Wolkow · Physical Review Letters · 1992 · 659 citations

, , +15

Theoretical study of the Si(100) surface reconstruction

A. Ramstad, Geert Brocks, Paul J. Kelly · Physical review. B, Condensed matter · 1995 · 418 citations · Full text

, , +17