Optik · 2014 · 33 citations · 56 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials ChemistryOptical MaterialsThin FilmsOptical Properties Of SolidsOptical Thin FilmsSemiconductor Thin FilmsThin Film AnnealingThin Film Optical PropertiesThin-film MaterialsAnnealing Temperature EffectsAntimony ChemistryAntimony SulfidesOptical ConstantsSulfidationThickness ControlThickness EffectsThin-film Optical Characterization
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X-ray line broadening from filed aluminium and wolfram
G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10.2K citations
Optical Processes in Semiconductors
J. I. Pánkové, D. A. Kiewit · Journal of The Electrochemical Society · 1972 · 4.6K citations