Review of Scientific Instruments · 1985 · 16 citations · 7 references
Natural SciencesMaterials SciencePhysicsMaterials CharacterizationSurface ChemistrySurface ScienceElectron DiffractionElectron MicroscopySurface CharacterizationSurface CrystallographySurface MicroscopySurface PhysicsAtomic-scale Surface ImagingDiffraction PatternsElectron Diffraction Of SurfacesHigh-resolution ImagingImaging ResolutionReflection MicroscopySpecimen Preparation For MicroscopySurface Diffraction Patterns
The REMEDIE system for reflection electron microscopy and electron diffraction at intermediate energies (0.5–20 keV) has been rebuilt with an improved imaging resolution of better than 10 nm, a convenient and versatile system for observation diffraction patterns and provision for specimen preparation and treatment suitable for surface structural studies. The current capabilities of the instrument are illustrated by results obtained from cleaved and annealed silicon (111) surfaces with or without thin deposited silver and gold layers.
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Surface imaging using diffracted electrons
Poul Erik Nielsen, J. M. Cowley · Surface Science · 1976 · 68 citations
Natural Sciences, Materials Engineering, Materials Science +12
Bragg diffraction imaging of defects at crystal surfaces
Henry Shuman · Ultramicroscopy · 1976 · 58 citations