Variable wavelength, variable angle ellipsometry including a sensitivities correlation test

An Algorithm for Least-Squares Estimation of Nonlinear Parameters

Donald W. Marquardt · Journal of the Society for Industrial and Applied Mathematics · 1963 · 30.4K citations

Natural Sciences, Computational Engineering, Optimization +11

Interspecimen Comparison of the Refractive Index of Fused Silica*,†

Irving H. Malitson · Journal of the Optical Society of America · 1965 · 4.1K citations

Natural Sciences, Materials Engineering, Materials Science +14

Optical Constants of Silicon in the Region 1 to 10 ev

H. R. Philipp, E. A. Taft · Physical Review · 1960 · 562 citations

Natural Sciences, Materials Science, Physics +17

Unambiguous determination of thickness and dielectric function of thin films by spectroscopic ellipsometry

Hans Arwin, D. E. Aspnes · Thin Solid Films · 1984 · 152 citations

Natural Sciences, Chemistry, Materials Science +17

Parameter-Correlation and Computational Considerations in Multiple-Angle Ellipsometry*

M.M. Ibrahim, N. M. Bashara · Journal of the Optical Society of America · 1971 · 85 citations

Natural Sciences, Chemistry, Analytical Chemistry +13