Journal of Applied Physics · 1995 · 13 citations · 16 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSolid State PhysicsThin FilmsDielectricsSuperconducting MaterialsSuperconducting Thin FilmsThin Film Electrical PropertiesThin-film MaterialsBuffer LayersCritical Current DensityCritical TemperatureCurrent DensityHigh-temperature SuperconductorsSuperconducting Critical TemperatureThin-film SuperconductorsX-ray Diffraction Analysis
Epitaxial Tl2Ba2CaCu2O8 superconducting films have been successfully grown on the dielectric Sr2(AlTa)O6 (SAT) buffer layers. X-ray diffraction data showed that the films were highly c-axis oriented with a rocking curve full width half maximum as narrow as 0.3°. The films also had an excellent in-plane epitaxy with Tl2Ba2CaCu2O8[100] aligned with SAT[100] and MgO[100] of the substrate. The zero resistance temperature Tc of the superconducting films ranged from 95 to 103 K and the transport critical current density Jc in zero field was 3×105 A/cm2 at 77 K.
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R. P. Reade, Paul Berdahl, R. E. Russo et al. · Applied Physics Letters · 1992 · 265 citations
Natural Sciences, Materials Engineering, Materials Science +11