Applied Physics Letters · 1992 · 124 citations · 11 references
Natural SciencesElectrical EngineeringMaterials ScienceMaterials CharacterizationMicrowave EngineeringThin FilmsMicrowave MaterialsSuperconducting MaterialsSuperconducting Thin FilmsTerahertz SpectroscopyThin Film Electrical PropertiesHigh-temperature Superconducting FilmsHigh-temperature SuperconductorsMagnetic Susceptibility MeasurementSuperconducting PropertiesSuperconducting ResonatorsSurface ResistanceSurface Resistance MeasurementX-ray Diffraction Analysis
Very low surface resistance Tl2Ba2CaCu2O8 films of thickness 1.0 μm on (100) LaAlO3 were fabricated and characterized. The films are highly c-axis oriented (x-ray diffraction rocking curve full width half maximum of 0.68°) with good in-plane epitaxy with respect to the substrate. The Tc of the films was 107.6±0.5 K as measured by ac magnetic susceptibility. The surface resistance at 10 GHz was measured with the parallel plate resonator technique and found to be 23±5 μΩ at 4.2 K, 130±20 μΩ at 77 K, and 300±60 μΩ at 95 K. Using a 20 GHz TE011 end-wall replacement copper cavity, the surface resistance was found to be comparable to that of copper, about 18 mΩ, at 104±1 K. The surface resistance of the films is significantly lower than that of all films reported to date at temperatures above 70 K and only slightly higher than the best high-temperature superconductor films reported to date at 4.2 K.
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Crystal structure of the high-temperature superconductor TI2Ba2CaCu2O8
M.A. Subramanian, J. C. CALABRESE, C.C. Torardi et al. · Nature · 1988 · 431 citations
Microwave properties of highly oriented YBa2Cu3O7−<i>x</i> thin films
A. Inam, X. D. Wu, L. Nazar et al. · Applied Physics Letters · 1990 · 128 citations