Solder Joint Reliability Prediction by the Integrated Matrix Creep Method

R. Iannuzzelli, James M. Pitarresi, V. Prakash

Journal of Electronic Packaging · 1996 · 18 citations · 2 references

Concepts

Abstract

The integrated matrix creep method for predicting the fatigue life of solder joints is presented. The application of the matrix creep life prediction method to a variety of solder joint/load combinations with a comparison to measured reliability data is presented as a validation of this technique. For a leadless chip carrier, the strain distribution in the solder is studied both through modeling and laser Moire interferometry. Finally, using this methodology as a design tool, the fatigue life simulation of a gull wing leaded package is presented in which various design parameters are modified and their effect on the fatigue life determined.

References

2