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Asymmetric versus symmetric dimerization on the Si(001) and As/Si(001)2 × 1 reconstructed surfaces as observed by grazing incidence X-ray diffraction

Materials ScienceReconstructed SurfacesIncidence X-ray DiffractionSurface CharacterizationEngineeringCrystalline DefectsPhysicsSurface AnalysisSurface ScienceApplied PhysicsCrystallographySurface Reconstruction