Concepedia
Microelectronics Reliability · 1998 · 19 citations · 2 references
Electrical EngineeringEngineeringStress-induced Leakage CurrentBias Temperature InstabilityApplied PhysicsEsd StressNmos BehaviorMicroelectronics
2
ESD in silicon integrated circuits
Microelectronics Reliability · 1996 · 442 citations
Electrical Engineering, Physical Design (Electronics), Engineering +4
Improving the ESD failure threshold of silicided n-MOS output transistors by ensuring uniform current flow
T. Polgreen, Amitava Chatterjee · IEEE Transactions on Electron Devices · 1992 · 156 citations
Device Modeling, Electrical Engineering, Semiconductor Device +12