Some elementary connections between curvature and mismatch strain in compositionally graded thin films

The determination of the elastic field of an ellipsoidal inclusion, and related problems

J. D. Eshelby · Proceedings of the Royal Society of London A Mathematical and Physical Sciences · 1957 · 12.8K citations · Full text

Natural Sciences, Materials Science, Mechanical Engineering +15

The tension of metallic films deposited by electrolysis

G. Stoney · Proceedings of the Royal Society of London Series A Containing Papers of a Mathematical and Physical Character · 1909 · 4.8K citations · Full text

Natural Sciences, Chemistry, Materials Science +11

Theory of thermal stresses

Journal of the Franklin Institute · 1960 · 383 citations

Engineering, Mechanical Engineering, Physics +11

Thin-films -- Stresses and mechanical properties 7

R. C. Cammarata, M. Nastasi, Esteban P. Busso et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 1998 · 168 citations

Natural Sciences, Materials Engineering, Materials Science +16

Principles and Applications of Wafer Curvature Techniques for Stress Measurements in Thin Films

Paul A. Flinn · MRS Proceedings · 1988 · 112 citations

Natural Sciences, Materials Engineering, Materials Science +16