Publication | Closed Access
Use of tertiarybutylarsine in the metalorganic chemical vapor deposition growth of GaAs
106
Citations
16
References
1987
Year
EngineeringCrystal Growth TechnologyNew Arsenic SourceOptoelectronic DevicesChemistrySemiconductorsSource RepurificationMolecular Beam EpitaxyEpitaxial GrowthCompound SemiconductorMaterials ScienceCrystalline DefectsOptoelectronic MaterialsSemiconductor MaterialEpitaxial FilmsApplied PhysicsThin FilmsOptoelectronicsChemical Vapor Deposition
Epitaxial films of GaAs have been grown by metalorganic chemical vapor deposition using a new arsenic source, tertiarybutylarsine (TBAs). Films with excellent surface morphology were obtained for low V/III values over a wide temperature range (600–800 °C), and relatively strong free-exciton emission was observed in the photoluminescence spectra. Hall measurements indicate carrier concentrations as low as 5×1015 cm−3 and mobilities μ300=4000 cm2/V s. These are equivalent or better than results obtained with trimethylarsenic. In contrast to growth with arsine, the layers were found to be n type for all values of V/III ratio investigated (2–20). Higher quality layers can be expected with source repurification of synthesis via a purer chemical process.
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