Journal of Applied Physics · 2002 · 330 citations · 27 references
Natural SciencesMaterials EngineeringMaterials ScienceComputational Materials ScienceMechanical Behavior Of MaterialsThin FilmsElastic DeformationElasticity TheoryResidual StressStrength Of MaterialsStress AnalysisStress-strain BehaviorBendingElastic Deformation ModelsFilm-substrate InteractionResidual Stress AnalysisResidual Stress EffectsResidual Stress In Thin FilmsResidual Stress ModelingResidual Stress Redistribution
A general closed-form solution for elastic deformation of multilayers due to residual stresses and external bending is derived. Based on the general solution, simplified solutions for residual stress distributions in multiple layers of thin films on a thick substrate are obtained. These simplified solutions can be expressed as functions of either mismatch strains between film layers and substrate or the curvature of the system. The simplified solution for the special case of one film layer on a substrate is also presented, and its accuracy is discussed.
27
Mechanical properties of thin films
William D. Nix · Metallurgical Transactions A · 1989 · 2.5K citations
Natural Sciences, Materials Engineering, Materials Science +15
Analysis of Bi-Metal Thermostats
S. Timoshenko · Journal of the Optical Society of America · 1925 · 2.4K citations
G. Hass, D. Gerstenberg · Journal of The Electrochemical Society · 1964 · 1.8K citations
Stress-related problems in silicon technology
S. M. Hu · Journal of Applied Physics · 1991 · 499 citations