Publication | Closed Access
Temperature measurements and thermal modeling of high power IGBT multichip modules for reliability investigations in traction applications
40
Citations
3
References
1998
Year
Electrical EngineeringReliability EngineeringEngineeringReliability InvestigationsTemperature MeasurementsPower DeviceHardware ReliabilityCircuit ReliabilityThermal ModelingElectronic PackagingHeat TransferPower ElectronicsThermal EngineeringPhysic Of FailureDevice Reliability
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