Solid-State Electronics · 1980 · 11 citations · 10 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesData RecoveryDevice ReliabilitySemiconductor ReliabilityStorage ReliabilityRecovery TimeRecovery Time MeasurementStorage Recovery
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Transient Response of a <i>p-n</i> Junction
Benjamin Lax, S. F. Neustadter · Journal of Applied Physics · 1954 · 216 citations