X-Ray Spectrometry · 2005 · 35 citations · 7 references
Natural SciencesChemistryMaterials ScienceAnalytical ChemistryOpticsSpectroscopyInorganic SpectroscopyOptical SpectroscopyRadiation SpectroscopyX-ray DetectionX-ray OpticsX-ray SpectroscopyBoron ChemistryEnergy-dispersive X-ray SpectroscopyInstrument Detection LimitMethod Detection LimitPolarized RadiationReflectometrySynchrotron X-ray SpectroscopyX-ray Mirrors
Abstract An La/B 4 C multilayer interferential mirror with small period d (4.8 nm) was produced by diode sputtering for the detection of the boron K emission by wavelength‐dispersive x‐ray spectrometry at a large Bragg angle (close to 45°). The structure of the mirror was characterized by grazing incidence x‐ray reflectometry and its performance at the energy of the boron K emission (183 eV) was evaluated by means of polarized synchrotron radiation. Spectrometric measurements showed that the La/B 4 C mirror improved the detection limit of boron using by a factor of 2 with respect to similar Mo/B 4 C mirrors and by a factor of 4 with respect to a lead stearate crystal. Copyright © 2005 John Wiley & Sons, Ltd.
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Multilayer mirror for x rays below 190 eV
C. Michaelsen, J. Wiesmann, R. Bormann et al. · Optics Letters · 2001 · 30 citations