Applied Physics Letters · 2013 · 21 citations · 20 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsElectronic MaterialsMaterials PhysicsCarrier TransportConductive MaterialsElectrical Properties Of CeramicsOxide SemiconductorsSemiconductor HeterostructuresSemiconductor InterfacesCarrier Transport MechanismsCharge Carrier DensityConductivityCritical ThicknessHall EffectHeterostructuresInsulator-to-metal TransitionMetal-insulator Transition
We investigate the effect of LaTiO3 insertion at the interface between LaAlO3 and TiO2 terminated {100} SrTiO3 for a series of LaAlO3 and LaTiO3 thicknesses. A clear increase of the carrier density was observed while the Hall mobility was largely unchanged. In structures with LaAlO3 thickness ∼3 unit cells, close to the critical thickness for conductivity, as little as 0.25 unit cells of LaTiO3 drives an insulator-to-metal transition. These samples show a strong dependence of the conductivity on voltage with electrostatic back-gating, which can be understood in a two-carrier picture, and dominated by the change in carrier density at the interface.
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