Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs - Concepedia

Concepedia

Publication | Open Access

Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs

DOI Full Paper Access

21

Citations

12

References

2014

Year

Fernanda Lima Kastensmidt, Jorge Tonfat, T. Both, Paolo Rech, Gilson Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost

Microelectronics Reliability

Electrical EngineeringSram-based FpgasEngineeringVlsi DesignHardware ReliabilityVlsi ArchitectureComputer EngineeringComputer ArchitectureSoft Error RateMicroelectronicsMemory ArchitectureVoltage Scaling

References

	Year	Citations

Page 1

Page 1