Technique used in Hall effect analysis of ion implanted Si and Ge - Concepedia

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Technique used in Hall effect analysis of ion implanted Si and Ge

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0

References

1970

Year

Nils Gunnar Johansson, J. W. Mayer, O. J. Marsh

Solid-State Electronics

Electrical EngineeringIon ImplantationEngineeringApplied PhysicsSilicon On InsulatorMicroelectronicsSemiconductor DeviceHall Effect Analysis

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