Electron Backscatter Diffraction: An Important Tool for Analyses of Structure–Property Relationships in Thin-Film Solar Cells

Beyond 11% Efficiency: Characteristics of State‐of‐the‐Art Cu₂ZnSn(S,Se)₄ Solar Cells

Teodor K. Todorov, Jiang Tang, Santanu Bag et al. · Advanced Energy Materials · 2012 · 1K citations

Engineering, Materials Engineering, Materials Science +17

Coincidence-site lattices and complete pattern-shift in cubic crystals

H. Grimmer, W. Bollmann, D. H. Warrington · Acta Crystallographica Section A · 1974 · 473 citations

Natural Sciences, Physics, Condensed Matter Physics +15

Cu2ZnSnS4 thin film solar cells from electroplated precursors: Novel low-cost perspective

A. Ennaoui, Martha Ch. Lux‐Steiner, A. Weber et al. · Thin Solid Films · 2008 · 424 citations

Natural Sciences, Materials Engineering, Materials Science +16

High resolution mapping of strains and rotations using electron backscatter diffraction

A.J. Wilkinson, Graham Meaden, D. J. Dingley · Materials Science and Technology · 2006 · 329 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Characterization of Grain Boundaries in Cu(In,Ga)Se$_{\bf 2}$ Films Using Atom-Probe Tomography

Oana Cojocaru‐Mirédin, Pyuck‐Pa Choi, Daniel Abou‐Ras et al. · IEEE Journal of Photovoltaics · 2011 · 96 citations

Natural Sciences, Materials Engineering, Materials Science +14