Applied Physics Letters · 1992 · 139 citations · 7 references
EngineeringElectrical EngineeringPhysicsOptoelectronicsSemiconductor DevicesSemiconductor MaterialsAbsorption SpectroscopyElectronic Material CharacterizationSemiconductor Device MaterialsSemiconductor PhysicsTerahertz PhotonicsTerahertz SpectroscopyConductanceTerahertz Absorption SpectroscopyTerahertz Material CharacterizationTerahertz Semiconductor DevicesTerahertz Semiconductor SpectroscopyTerahertz Time-domain SpectroscopyTime-domain Terahertz Spectroscopy
Using a high-performance optoelectronic THz beam system for time-domain spectroscopy, we have measured the absorption and index of refraction of N- and P-type doped GaAs from low frequencies to 4 THz. From these measurements the complex conductance was obtained over the same frequency range. All of the results were well fit by Drude theory.
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