Optical and electronic properties of doped silicon from 0.1 to 2 THz

Martin van Exter, D. Grischkowsky

Applied Physics Letters · 1990 · 302 citations · 11 references

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Abstract

Using a source of freely propagating subpicosecond pulses of THz radiation, we have measured the absorption and dispersion of both N- and P-type, 1 Ω cm silicon from 0.1 to 2 THz. These results give the corresponding frequency-dependent complex conductance over the widest frequency range to date. The data provide a complete view on the dynamics of both electrons and holes and are well fit by the simple Drude relationship.

References

11