Concepedia

Reactions at the Al/SiO2/SiC layered interface

A.E. Hughés, Martin Hedges, B.A. Sexton

Journal of Materials Science · 1990 · 48 citations · 37 references

DOI

Concepts

References

37

Smoothing and Differentiation of Data by Simplified Least Squares Procedures.

Abraham Savitzky, Marcel J. E. Golay · Analytical Chemistry · 1964 · 21.3K citations

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Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eV

J. H. Scofield · Journal of Electron Spectroscopy and Related Phenomena · 1976 · 5.9K citations

, , +7

General Relationship for the Thermal Oxidation of Silicon

B. E. Deal, Andrew S. Grove · Journal of Applied Physics · 1965 · 3.4K citations

, , +17

Auger and photoelectron line energy relationships in aluminum–oxygen and silicon–oxygen compounds

C. D. Wagner, D. E. Passoja, H. F. Hillery et al. · Journal of Vacuum Science and Technology · 1982 · 832 citations

, , +15

Data analysis techniques in x-ray photoelectron spectroscopy

Andrew Proctor, Peter M. A. Sherwood · Analytical Chemistry · 1982 · 390 citations

, , +6