Concepedia

Atomic level analysis of electron emitter surfaces by the scanning atom probe

Osamu Nishikawa, Kiyoshi Maeda, Y. Ohtani, Masafumi Watanabe, Keiji Tanaka, Takahiro Sekine, M. Iwatsuki, Susumu Aoki, J. Itoh, Kenta Yamanaka

Applied Surface Science · 1999 · 11 citations · 7 references

DOI

Concepts

References

7

The Atom-Probe Field Ion Microscope

Erwin W. Müller, J. A. Panitz, S. B. McLane · Review of Scientific Instruments · 1968 · 637 citations

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Toward a scanning atom probe — computer simulation of electric field -

Osamu Nishikawa, Masahiro Kimoto · Applied Surface Science · 1994 · 94 citations

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Light volatiles in diamond: Physical interpretation and genetic significance

J.P.F. Sellschop, C.C.P. Madiba, H.J. Annegarn · Nuclear Instruments and Methods · 1980 · 65 citations

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Performance of the new high mass resolution time of flight atom probe

Osamu Nishikawa, Kazuaki Kurihara, M. Nachi et al. · Review of Scientific Instruments · 1981 · 53 citations

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Development of a scanning atom probe and atom-by-atom mass analysis of diamonds

Osamu Nishikawa, Takahiro Sekine, Y. Ohtani et al. · Applied Physics A · 1998 · 19 citations

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