Publication | Closed Access
Write current dependence of transition noise in thin film media
10
Citations
9
References
1990
Year
EngineeringMagnetic ResonanceMagnetic MaterialsMagnetismBulk Magnetic ParametersWriting ProcessMagnetic Data StorageNoiseComplex BehaviorMagnetic Thin FilmsThin Film ProcessingMaterials ScienceElectrical EngineeringPhysicsWrite Current DependenceMagnetic MeasurementSemiconductor MaterialSemiconductor Device FabricationMicroelectronicsMicro-magnetic ModelingMagnetic MediumNatural SciencesApplied PhysicsThin FilmsMagnetic DeviceMagnetic Property
Complex behavior of the noise in thin-film recording media is observed with regard to its dependency on bulk magnetic parameters, recording density, write current, and alloy composition. The pattern of this complex behaviour is the results of the writing process and thus reflects only the bulk magnetic properties of the medium, whereas the amplitude of the noise voltage is seen to be associated with the nature of the magnetic alloy films.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
| Year | Citations | |
|---|---|---|
Page 1
Page 1