Doug Williams

A study of the leakage mechanisms of silicided <i>n</i>+/<i>p</i> junctions

Ruizhe Liu, Doug Williams, W.T. Lynch · Journal of Applied Physics · 1988 · 128 citations

Electrical Engineering, Engineering, Crystalline Defects +12

The structure of binary alkali silicate glasses

R. Dupree, D. Holland, Doug Williams · Journal of Non-Crystalline Solids · 1986 · 101 citations

Materials Science, Materials Engineering, Glass-ceramic +4

Origin of deep subgap states in amorphous indium gallium zinc oxide: Chemically disordered coordination of oxygen

Shawn Sallis, Keith T. Butler, Nicholas F. Quackenbush et al. · Applied Physics Letters · 2014 · 80 citations

Materials Science, Inorganic Chemistry, Ii-vi Semiconductor +13

Multilayer diffusional growth in silver-zinc alloys

Doug Williams, Robert A. Rapp, J. P. Hirth · Metallurgical Transactions A · 1981 · 66 citations

Materials Engineering, Materials Science, Engineering +6

A symmetric submicron CMOS technology

S.J. Hillenius, R. Liu, G. E. Georgiou et al. · 1986 · 66 citations

Engineering, Computer Architecture, Integrated Circuits +16