Publication | Closed Access
Simultaneous Observation of Millisecond Dynamics in Atomistic Structure, Force and Conductance on the Basis of Transmission Electron Microscopy
87
Citations
17
References
2001
Year
Atomic Force MicroscopyEngineeringMultiscale MechanicsTransmission Electron MicroscopyMicroscopyElectron DiffractionAtomistic StructureElectron MicroscopyMicroscopy MethodBiophysicsAtomic-scale MechanicsMaterials SciencePhysicsSubnano Newton-scale ForceNanotechnologyAtomic PhysicsMicrostructureNanophysicsSimultaneous ObservationScanning Probe MicroscopyMaterials CharacterizationApplied PhysicsSurface ScienceScanning Force MicroscopyElectron MicroscopeMedicine
High-resolution transmission electron microscopy (HRTEM) has been developed to possess functions of atomic force microscopy and scanning tunneling microscopy. Dynamics of subnano Newton-scale force and conductance were simultaneously observed at intervals of 1/30–1/3840 s during HRTEM imaging of contact, deformation and fracture processes between nanometer-sized tips. The experimental basis of the atomic-scale mechanics of materials was developed on the basis of the present microscopy.
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