Reflectance spectroscopy on GaN films under uniaxial stress

Abstract

The uniaxial stress effects on valence band structures in GaN are investigated by reflectance spectroscopy. It is observed that the energy separation between A and B valence bands increases with the application of uniaxial stress in the c plane. The experimental results are analyzed on the basis of the k⋅p theory, and deformation potential D5 is determined as −3.3 eV. It is indicated that the uniaxial strain effect could be utilized for improving GaN-based laser performance.