Concepedia

Optimum correction conditions for aberration-corrected HRTEM SiC dumbbells chemical imaging

M. Texier, Jany Thibault-Pénisson

Micron · 2011 · 15 citations · 24 references

DOI

Concepts

References

24

EMS - a software package for electron diffraction analysis and HREM image simulation in materials science

PA Stadelmann · Ultramicroscopy · 1987 · 2K citations · Full text

, , +15

Electron microscopy image enhanced

Maximilian Haider, Stephan Uhlemann, Eugen Schwan et al. · Nature · 1998 · 1.1K citations

, , +6

The Theoretical Resolution Limit of the Electron Microscope

Otto Scherzer · Journal of Applied Physics · 1949 · 916 citations

, , +14

<i>Experimental High-Resolution Electron Microscopy</i>

J. C. H. Spence, Albert V. Crewe · Physics Today · 1981 · 716 citations

, , +9

Experimental High-resolution Electron Microscopy

T. Mulvey · Optica Acta International Journal of Optics · 1981 · 470 citations

, , +6