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Impact of using adaptive body bias to compensate die-to-die <i>Vt</i> variation on within-die <i>Vt</i> variation
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1999
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EngineeringKinesiologyAdaptive Body BiasLow Power ElectronicsComputer EngineeringBiostatisticsDie-to-die Vt VariationMicroelectronicsStatistics
Article Free Access Share on Impact of using adaptive body bias to compensate die-to-die Vt variation on within-die Vt variation Authors: Siva Narendra Microsystems Technology Laboratory, MIT, Cambridge, MA Microsystems Technology Laboratory, MIT, Cambridge, MAView Profile , Dimitri Antoniadis Microsystems Technology Laboratory, MIT, Cambridge, MA Microsystems Technology Laboratory, MIT, Cambridge, MAView Profile , Vivek De Microcomputer Research Laboratory, Intel Corp., Hillsboro, OR Microcomputer Research Laboratory, Intel Corp., Hillsboro, ORView Profile Authors Info & Claims ISLPED '99: Proceedings of the 1999 international symposium on Low power electronics and designAugust 1999 Pages 229–232https://doi.org/10.1145/313817.313932Published:17 August 1999Publication History 31citation650DownloadsMetricsTotal Citations31Total Downloads650Last 12 Months103Last 6 weeks17 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF
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