Ultrahigh-density data storage on a novel organic thin film achieved using a scanning tunnelling microscope

Abstract

An organic thin film of N, N-dimethyl-N'(3-nitrobenzylidene)-p-phenylenediamine with electrical bistability properties was prepared by the vacuum deposition method. The film was observed with a scanning tunnelling microscope (STM). Ultrahigh-density data storage is demonstrated on the organic film, produced by applying a voltage pulse between the STM tip and the substrate of the thin film under ambient conditions. The average size of the recording marks is about 0.7 nm, corresponding to a data storage density of about 1013 bits cm−2. The local current–voltage curves of the film suggest that the recorded area is conductive, while the unrecorded region possesses high resistance. The recording mechanism is also discussed.