Publication | Closed Access
Observation of Si(100) surface with noncontact atomic force microscope at 5K
35
Citations
18
References
2002
Year
Materials ScienceSurface CharacterizationEngineeringPhysicsMicrofabricationMicroscopyScanning Probe MicroscopySurface ScienceApplied PhysicsScanning Force MicroscopySurface AnalysisSilicon On Insulator
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