IEEE Microwave Magazine · 2005 · 23 citations · 22 references
EngineeringElectrical EngineeringInstrumentationMicroelectronicsMicrowave EngineeringDevice CharacterizationElectrical MeasurementMeasurement System AnalysisMicrowave MeasurementsMicrowave Network AnalysisPower DividersCalibration ProceduresMicrostrip Transmission LinesMicrowave Component CharacterizationMicrowave Network CharacterizationNetwork Parameter ExtractionS-parameter CharacterizationS-parameter MeasurementVector Network Analysis
An increasing number of multiport devices, whether they be multiband wireless phone components, backplane balanced transmission lines, or classical devices such as power dividers, are being characterized in the RF, microwave, and millimeter-wave frequency bands. S-parameter measurements are often required, and ordinary vector network analyzer (VNA) measurements must be modified to perform these measurements quickly and accurately. This article explores a number of hardware architectures and calibration procedures for multiport measurements and their impacts on flexibility and uncertainties.
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