Applied Physics Letters · 1986 · 37 citations · 5 references
Natural SciencesChemistryMaterials ScienceSemiconductor DevicesSemiconductor MaterialsSpectroscopyAbsorption SpectroscopyAnalytical CalibrationElectronic Material CharacterizationOptical Properties Of SemiconductorsRadiometric CalibrationSpectral CalibrationAbsorption SpectraCarrier ConcentrationSemiconductor CharacterizationVibrational Absorption BandsVibrational Mode Analysis
The residual carbon acceptor concentration [CAs] in three radio-tin-doped, liquid encapsulated Czochralski, GaAs single crystals was estimated from a plot of carrier concentration versus tin concentration determined by radio-tracer counting. Local vibrational mode absorption of CAs in the samples was measured at room temperature and a calibration factor of 8±2×1015 cm−1 obtained. A comparison of this with other determinations suggests that the true calibration factor lies between 8 and 11×1015 cm−1 and that earlier, larger calibration factors should be discounted.
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Carbon in semi-insulating, liquid encapsulated Czochralski GaAs
A. T. Hunter, Hiroshi Kimura, J. P. Baukus et al. · Applied Physics Letters · 1984 · 78 citations