Journal of Physics D Applied Physics · 1984 · 45 citations · 17 references
EngineeringElectrical EngineeringPhysicsMicroelectronicsSemiconductor DevicesSpectroscopyAnode MaterialsElectric CircuitsElectrical CharacterizationElectrode KineticsElectron TransportWorking ElectrodesField Emission
An anode probe-hole technique, in conjunction with an electron spectrometer, has been used to study the short-term temporal changes in the emission characteristics of microscopically localised field emission sites on broad-area high voltage electrodes. The observed effects, e.g. the threshold switch-on of sites, and emission mode switching, have been discussed in terms of a new field-induced hot-electron emission model which is based on the concept of dielectric switching through the formation of microscopic conducting channels.
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Electrical phenomena in amorphous oxide films
G. Dearnaley, A.M. Stoneham, D. V. Morgan · Reports on Progress in Physics · 1970 · 729 citations · Full text
On state of amorphous threshold switches
K. Petersen, David Adler · Journal of Applied Physics · 1976 · 112 citations · Full text
The nature of field emission sites
B M Cox · Journal of Physics D Applied Physics · 1975 · 77 citations