Scanning Electron Microscope Observation of Magnetic Domains Using Spin-Polarized Secondary Electrons

Abstract

A new method for observing magnetic domain structures with a scanning electron microscope has been developed in which the image is the result of spin polarization of secondary electrons. With this method the domain structures on an iron (001) surface have been observed. At present, spatial resolution is not less than 10 µm, but can be expected to be reduced to far less than that of both conventional electron microscopic and optical reflection methods.