Publication | Closed Access
Imaging steep, high structures by scanning force microscopy with electron beam deposited tips
167
Citations
8
References
1992
Year
Materials ScienceEngineeringElectron MicroscopyElectron BeamMicrofabricationMicroscopyHigh StructuresMicroscopy MethodApplied PhysicsScanning Force MicroscopyScanning Probe MicroscopyElectron MicroscopeForce MicroscopyMicrostructure
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