A virtual dynamic atomic force microscope for image calculations

Abstract

Calculations of frequency modulation-atomic force microscopy (FM-AFM) images are presented. A virtual FM-AFM, which realistically simulates the experiment by including the control system of the microscope, is implemented in order to go beyond the usual static approximation. It is shown that the results obtained within the static approach can be recovered in the limit of small scanning speed, while images at realistic scanning speed are distorted. The influence of the experimental noise on the images is investigated, allowing us to evaluate the sensitivity of the instrument.