Comparison of EBIC and DLTS Measurements on Boron-Doped CZ Silicon Contaminated with Iron - Concepedia

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Comparison of EBIC and DLTS Measurements on Boron-Doped CZ Silicon Contaminated with Iron

18

Citations

2

References

1986

Year

M. Kittler, W. Seifert, K. Schmalz, K. Tittelbach‐Helmrich

physica status solidi (a)

Electrical EngineeringEngineeringIntrinsic ImpurityApplied PhysicsDlts MeasurementsSilicon On InsulatorSilicon Debugging

References

	Year	Citations

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