Concepedia

Publication | Closed Access

Pulsed stress reliability investigations of schottky diodes and HBTS

DOI

24

Citations

3

References

1996

Year

Viktor Krozer, Karlheinz Bock, M. Brandt, L. Vecci, Raffaele Losi, H.L. Hartnagel
Microelectronics Reliability

References

YearCitations

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