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Raman analysis of light-emitting porous silicon
339
Citations
16
References
1992
Year
Materials SciencePolarization RamanEngineeringNanoporous MaterialPhysicsPhonon ConfinementOptical PropertiesNanotechnologySurface ScienceApplied PhysicsPhotoluminescencePhononSurface-enhanced Raman ScatteringRaman AnalysisPorous SiliconOptical CharacterizationOptoelectronicsSilicon On Insulator
Porous silicon that strongly emits in the visible was analyzed using Raman scattering. The spectrum peaks near 508 cm−1, has a width of ∼40 cm−1, and is very asymmetric. Using a model of phonon confinement, this suggests that the local structure of porous silicon is more like a sphere than a rod and has a characteristic diameter of 2.5–3.0 nm. Polarization Raman measurements suggest that the structure does not consist of a series of parallel columns.
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