Publication | Closed Access
The Dynamic Dielectric Function in HgSe and HgTe
40
Citations
15
References
1978
Year
Optical MaterialsEngineeringAbsorption SpectroscopyOptical CharacterizationSpectroscopic PropertyOptical PropertiesDynamic Dielectric FunctionOptical SpectroscopyObserved InterferencePhysicsInfrared SpectroscopyTime-dependent Dielectric BreakdownElectrical PropertyNatural SciencesSpectroscopyAbstract Absorption MeasurementsApplied PhysicsCondensed Matter PhysicsHigh-frequency ApproximationLight AbsorptionOptoelectronics
Abstract Absorption measurements in the infrared region from 5 to 30 μm for HgTe at 295 K and for HgSe at 10, 80, and 295 K are performed. On the basis of the observed interference phenomena the dependence of the refractive index on the wavelength is obtained. These results are analysed in terms of the dynamic dielectric function. The contribution of the Γ → Γ transitions is calculated in terms of Kane's band structure model. From the comparison of theoretical results and experimental data the value of ϵ′∞, treated as a fitting parameter, is determined. The relation ϵ′∞( T ) determined for HgSe is somewhat different from that found for HgTe and differs from the value proposed earlier for HgSe.
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