Interconnect design and analysis for Through Silicon Interposers (TSIs)

Abstract

The trend of increasing digital system performance by downscaling the device size poses daunting challenges in system design due to the increased power density, higher I/O count, interconnect bandwidth, and timing closure requirements. Silicon carrier with Through Silicon Vias (TSVs) or TSI technology is identified as a system and packaging level solution to overcome all those challenges. In this paper we describe the key electrical elements in a typical TSI digital system and discuss their impact on overall system performance. We also discuss the system level power integrity analysis for TSI as its power delivery is one of the major engineering challenges.